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9813DXC excels in fast, high-resolution low frequency noise measurement for diverse requirements, helping chip manufacturers identify and eliminate defects for reliable, high-performance chips.

• Accommodate a complete range of measurement conditions for both high and low impedance devices, ranging from 10Ω to 10MΩ

• Delivers a significant and innovative improvement in hardware and software design to meet the challenge of explosive growth requirements for low frequency noise test of advanced technology nodes, especially FinFET technology

• Used in conjunction with the Primarius semiconductor parameter testing system FS-Pro, providing a parallel testing framework solution that significantly improves testing efficiency and throughput

• Applies for 14/10/7/5nm technology node
  

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