欢迎光临影响国际采购成本定价的因素包括。临朐天艺数控设备厂

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SPICE Model
Baseband Modeling
• BSIMProPlus
RF Modeling
• MeQLab
Model Extraction Automation
• SDEP
Model QA
• ME-Pro
PDK
PCell Development
• PCellLab
PDK Verification
• PQLab
Standard Cell
Library Characterization
• NanoCell
Library Validation
• LibWiz

Design Environment
Schematic Capture
• NanoDesigner SE
Layout Editor
• NanoDesigner LS
Interactive Physical Verification
• NanoDesigner iV
Design Optimization
• NanoDesigner Optimizer
Circuit Simulation
SPICE Simulator
• NanoSpice • NanoSpice X • NanoSpice Giga
FastSPICE Simulator
• NanoSpice Pro • NanoSpice Pro X
Mixed Signal
• NanoSpice MS
Waveform Analysis
• NanoWave
Circuit Analysis
Static and Dynamic Circuit Check
• NanoSpice CCK
Yield Analysis
• NanoYield
Signal Integrity
• NanoSpice SI
Critical Path Analysis
• PathInspector
Power Device Design Verification
• PTM
Power Distribution Network Analysis

ESD Verification
• ESDi

Circuit Simulation
Digital Simulation
• VeriSim
Standard Cell
Library Characterization
• NanoCell
Library Validation
• LibWiz
Design & Verification
Timing Analysis
• TRASTA
Floor Planning
• NavisPro
Signal Integrity Analysis
• NanoSpice SI
Power Design Analysis
• PTM
ESD Verification
• ESDi
Chip-to-Package Connectivity Verification
• PadInspector

Parametric Testing
Semiconductor Parametric Analyzer
• FS-Pro • FS800
Noise Measurement
Low Frequency Noise
• 9812DX • 9812E • 9813DXC
AC Dynamic Noise
• 9812AC
Integrated Testing

Electrical Parameter Testing Software
• LabExpress

Design & Verification

HomeProductsDigital Design EDA

Circuit Simulation
Digital Simulation
VeriSim
Standard Cell
Library Characterization
NanoCell
Library Validation
LibWiz
Design & Verification
Timing Analysis
TRASTA
Floor Planning
NavisPro
Signal Integrity Analysis
NanoSpice SI
Power Design Analysis
PTM
ESD Verification
ESDi
Chip-to-Package Connectivity Verification
PadInspector

NanoSpice SI|NavisPro|PadInspector|TRASTA|PTM|ESDi

PTM

Power Device Design Verification

Rdson ExtractionGate Delay AnalysisElectro-thermal Analysis

PTM is a suite of tools to enhance the design analysis of power device, recognized and adopted by the top-ranking power device IDMs and Fabless companies. It can extract Rdson with high precision and verify the device's switching behavior, ensuring the product's reliability and lifespan.

Utilizing the edge-based 3D solver, optimizing Rdson and gate delay in power transistor arrays
Verifying current density "hot-spots", checking electro-migration violation
Optimizing layout and pad placement, detecting missing vias and metal current crowding
Extending to power device die, package, and PCB co-simulation, ensuring an optimal thermal performance
Integrated with user-friendly results viewer with cross-linked reports and field views

Download Brochure

Highlights

Accurate
High precision parameter extraction
and optimization
Rich Views
2D view, solver view,
and field view
Layout Optimization
Analyze pad
and via placement
Reliability
Analyze potential issues like electromigration,
overheating failures, etc.
Dynamic Analysis
Simulation based transient
ET analysis
Switching Behaviour
Maximize switching
frequency

Applications

Power device
design analysis(IGBT)
Automotive IC
design analysis
Power IC design analysis (PMIC/
DC-DC converters)
Mixed-signal IC
design analysis
Co-optimization of ET performance(in
Chip/Package/PCB)
High voltage
GAN device
design analysis

Videos

Watch Video

Technical Documents

AppNote

How Electrothermal
Analysis Avoid
Thermal Runaway
in CU-Clip Packages

Success Cases

A leading IDM company adopted Primarius’s PTM platform for design iteration and optimization while developing a power protection chip for USB interfaces and hard disk drives. The chip must accurately sense current and temperature changes during hot swapping and automatically cut off high voltage or high current, making the placement of sensors critical. Using PTM’s electrothermal analysis tools, the customer accurately identified the hotspots of power transistors and optimized the placement of sensors, ensuring reliable over-temperature and over-current protection, which significantly improved the product’s performance and quality.

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技术支持-临朐天艺数控设备厂