Easy to operate with powerful functions that supports various user-defined settings including RF characteristic testing, data de-embedding, characterization, parameter extraction, etc.
Various device testing templates enable efficient on-chip device IV/CV/RF characteristic testing, supporting up to 110GHz S-parameter measurement and parameter transformation
Built-in NanoSpice simulator engine allows for smooth conversion from baseband modeling cards to RF modeling cards, DC characteristics verification, RF model parameter extraction, model library generation
Multi-level model verification solutions covering RF data verification, model fitting & extraction verification, extensible model verification and model library verification, etc.
Automatic one-click generation of modeling/verification reports in Word, PPT, Excel, HTML, PDF and other formats based on customer requirements
SPICE Model
PDK
Standard Cell
Design Environment
Circuit Simulation
Circuit Simulation
Design & Verification
Parametric Testing
Noise Measurement
Integrated Testing
