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Parametric Testing

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FS-Pro|FS800

FS800

Device Parameter Analyzer

Parameter TestingReliability TestingHigh-Speed Pulse Measurement

FS800 Device Parameter Analyzer is a multi-functional  electrical characterization instrument.

  • Customizable and expandable IV, CV, low-frequency noise testing, and ultra-fast IV measurement capabilities to meet almost all testing requirements

  • Flexible modular architecture with the semiconductor characterization system mainframe and plug-in modules, providing a single-box solution for wafer-level automated testing

  • Support up to 24 SMUs or 132 channels switch matrix

  • Support multi-channel and multi-site parallel testing

  • The Built-in professional testing software LabExpress offers intuitive GUI interface with 18.5-inch touch screen, featuring rich ready-to-use library of application tests and powerful data analysis functionalities, while also supporting customizable algorithm, test flow and complex calculation

  • Wide test applications for semiconductor devices, LED materials, 2D materials, nano-materials, and novel devices

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Highlights

  • Powerful Capability

    Wide bias range and high precision
    High-speed sampling time-domain signal acquisition
    Arbitrary linear waveform generation

  • All-In-One Solution

    A single-box solution that covers
    all-around device parametric testing applications
    IV, CV, transient IV sampling, high-speed
    waveform generation & measurement

  • High Scalability

    Supports installing up to 24 SMUs
    or 132-channel switch matrix,
    Supports hybrid architecture of
    SMU and switch matrix

  • Efficiency

    Supports automated testing of
    wafer-level electrical parameters
    in a single instrument
    Supports parallel testing

  • Easy to Use

    Built-in LabExpress testing software
    rich ready-to-use algorithm presets,
    data analysis tools
    and flexible customization

Applications

  • Process development
    & device parameter testing

  • Semiconductor
    device reliability
    testing

  • Semiconductor
    device ultrashort
    pulse testing

  • Non-Volatile
    Memory

  • Opto-electronic
    device & MEMS measurement

  • 2D materials
    device testing

  • Metal material
    testing

  • Advanced materials
    and device testing

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